The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 22, 2021
Filed:
Mar. 13, 2020
Fanuc Corporation, Yamanashi, JP;
Hikaru Koshiishi, Yamanashi, JP;
FANUC CORPORATION, Yamanashi, JP;
Abstract
A spindle abnormity detection device includes a first sensor configured to measure oscillation of a spindle of a machine tool, a second sensor configured to measure radial runout of an axis of a tool unit attached to the spindle, and a computer configured to perform abnormity determination of the spindle based on an oscillation comparison result and a runout comparison result, the oscillation comparison result being obtained by comparing a detection result obtained by the first sensor with an oscillation standard of the spindle, the runout comparison result being obtained by comparing a detection result obtained by the second sensor with a runout standard of the tool unit.