The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 22, 2021
Filed:
Apr. 19, 2019
GE Precision Healthcare Llc, Wauwatosa, WI (US);
Sergio Lemaitre, Milwaukee, WI (US);
John Boudry, Waukesha, WI (US);
Bradley Gabrielse, Waukesha, WI (US);
Ryan Lemminger, Milwaukee, WI (US);
Spencer Cutler, Waukesha, WI (US);
GE PRECISION HEALTHCARE LLC, Wauwatosa, WI (US);
Abstract
A system and method for calibrating an X-ray tube is provided in which the X-ray tube includes an electronic storage medium associated with the X-ray tube on which calibration information for the X-ray tube is stored. The calibration information includes operating parameters for the focusing elements of the X-ray tube for desired focal spots, tolerance limits for variations in the focal spots and a number of gradient coefficient values corresponding to certain modulation transfer functions (MTF) for the X-ray tube that the imaging system can employ in an iterative manner to correct the operating parameters of the focusing elements to achieve the desired focal spot. This automatic iterative process significantly reduces the time required for the calibration of the X-ray tube. The system and method also employs scan sequencing to minimize the heat generated enabling the scans to be completed in a shorter amount of time than prior calibration processes.