The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 15, 2021

Filed:

Aug. 01, 2018
Applicant:

SK Hynix Inc., Icheon-si, KR;

Inventors:

Tae Sik Yun, Seoul, KR;

Chun Seok Jeong, Seoul, KR;

Assignee:

SK hynix Inc., Icheon-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/27 (2006.01); G11C 29/44 (2006.01); G11C 29/42 (2006.01); G11C 29/36 (2006.01); G06F 11/263 (2006.01);
U.S. Cl.
CPC ...
G11C 29/4401 (2013.01); G06F 11/263 (2013.01); G06F 11/27 (2013.01); G11C 29/36 (2013.01); G11C 29/42 (2013.01);
Abstract

A memory system and a method for operating the same, wherein the memory system includes a first memory and a second memory each configured to store data. The memory system further includes a test and repair circuit operationally connected to the first memory and to the second memory. The test and repair circuit is configured to receive a test initiation signal and perform, in response to receiving the test initiation signal, a test operation on at least one of the first memory and the second memory. The test and repair circuit is also configured to perform, based on a result of the test operation, a repair operation on the at least one of the first memory and the second memory.


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