The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 15, 2021

Filed:

Nov. 07, 2019
Applicant:

SK Hynix Inc., Gyeonggi-do, KR;

Inventors:

Myeong-Jae Park, Gyeonggi-do, KR;

Chun-Seok Jeong, Seoul, KR;

Assignee:

SK hynix Inc., Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 5/14 (2006.01); G11C 7/10 (2006.01); H01L 23/00 (2006.01); G11C 7/22 (2006.01); H01L 25/065 (2006.01);
U.S. Cl.
CPC ...
G11C 7/1087 (2013.01); G11C 7/1093 (2013.01); G11C 7/222 (2013.01); H01L 24/14 (2013.01); H01L 25/0657 (2013.01); H01L 2224/1403 (2013.01);
Abstract

A stacked memory device includes: a plurality of semiconductor chips that are stacked and transfer signals through a plurality of through-electrodes, wherein at least one of the semiconductor chips comprises: a re-timing circuit suitable for receiving input signals and first and second clocks, performing a re-timing operation of latching the input signals based on the second clock to output re-timed signals, and reflecting a delay time of the re-timing operation into the first clock to output a replica clock; and a transfer circuit suitable for transferring the re-timed signals to the through-electrodes based on the replica clock.


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