The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 15, 2021

Filed:

Sep. 19, 2018
Applicant:

Fujitsu Limited, Kawasaki, JP;

Inventor:

Yukio Hirai, Akashi, JP;

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/80 (2017.01); G06K 9/62 (2006.01); H04N 5/247 (2006.01); G06T 3/00 (2006.01); H04N 5/232 (2006.01); H04N 17/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/80 (2017.01); G06K 9/6211 (2013.01); G06T 3/0018 (2013.01); H04N 5/23227 (2018.08); H04N 5/23238 (2013.01); H04N 5/247 (2013.01); H04N 17/004 (2013.01); G06T 2207/30204 (2013.01);
Abstract

A camera control method including performing first detection processing that detects a plurality of predetermined patterns at different positions in real space from one or more images captured by a first camera, acquiring camera characteristic information on the first camera based on one or more first predetermined patterns, included in the plurality of predetermined patterns, successfully detected in the first detection processing, correcting the one or plurality of images based on the acquired camera characteristic information, performing second detection processing to detect one or more second predetermined patterns, included in the plurality of predetermined patterns, that failed to be detected in the first detection processing, the one or more second predetermined patterns being included in the one or more images on which the correcting has been performed, and updating the camera characteristic information based on the detected one or more second predetermined patterns.


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