The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 15, 2021

Filed:

May. 24, 2019
Applicant:

Toyota Research Institute, Inc., Los Altos, CA (US);

Inventor:

Hiroyuki Funaya, Ann Arbor, MI (US);

Assignee:

Toyota Research Institute, Inc., Los Altos, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/73 (2017.01); G06T 7/521 (2017.01);
U.S. Cl.
CPC ...
G06T 7/73 (2017.01); G06T 7/521 (2017.01); G06T 2207/10028 (2013.01); G06T 2207/10052 (2013.01);
Abstract

Systems and methods described herein relate to detecting objects. One embodiment receives a plurality of three-dimensional (3D) data points from a plurality of light beams emitted by one or more sensors; identifies, among the plurality of 3D data points, a first set of inlier points that satisfy a first predetermined error condition with respect to a plane hypothesis and a first set of outlier points that fail to satisfy the first predetermined error condition; identifying, among the first set of inlier points, a second set of outlier points, the second set of outlier points failing to satisfy a second predetermined error condition in a range domain with respect to a plurality of line hypotheses corresponding, respectively, to the plurality of light beams; and detecting an object based, at least in part, on at least one of the first set of outlier points and the second set of outlier points.


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