The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 15, 2021
Filed:
Apr. 10, 2014
X - Sight Systems Ltd., Rosh HaAyin, IL;
Alon Nitzan, Rosh HaAyin, IL;
Aviv Goner, Kibbutz NaAn, IL;
Kfir Gedalyahu, Tel Aviv, IL;
Lonia Kanelovitch, Holon, IL;
Uri Hadar, Kiryat-Ono, IL;
Yaniv Leitner, ModiIn, IL;
Gaby Bar-Haim, Givatayim, IL;
Oded Hanson, Givatayim, IL;
X - Sight Systems Ltd., Rosh HaAyin, IL;
Abstract
Systems and methods are described, including a system () for automatically ascertaining a height characteristic of a contaminant () on a travel surface (). The system () comprises an illumination and imaging device (). At a first time, when the travel surface () is generally free of contaminant, the illumination and imaging device () illuminates the travel surface () with at least one light beam (), and images at least one impingement of the at least one light beam (). At a second time, when the travel surface () is covered by a layer of contaminant (), the illumination and imaging device () illuminates the travel surface with a light beam (), and images an impingement of the light beam on an impingement surface (). In response to the imaging, a computer () calculates the height characteristic of the contaminant. Other embodiments are also described.