The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 15, 2021
Filed:
Jul. 01, 2019
Olympus Corporation, Tokyo, JP;
Naohiro Ariga, Tokyo, JP;
Shintaro Takahashi, Tokyo, JP;
Yohei Tanikawa, Tokyo, JP;
Shinichi Takimoto, Tokyo, JP;
OLYMPUS CORPORATION, Tokyo, JP;
Abstract
A cell observation system includes an imaging element that acquires images of the inside of a culture container in which cells are cultured, the imaging element acquiring the images over time; a computer configured to: quantitatively analyze a culture state of the cells cultured in the culture container on the basis of each of the images acquired by the imaging element; and statistically analyze the quantitatively analyzed data; and a display that displays statistical analysis results in the culture container within a plurality of subculture periods obtained by the computer in a manner allowing comparison of the statistical analysis results.