The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 15, 2021
Filed:
Dec. 23, 2019
Seiko Epson Corporation, Tokyo, JP;
Ryoki Watanabe, Matsumoto, JP;
Abstract
A visual inspection device includes a spectroscope that selectively transmits a wavelength of light reflected by a target object, a camera that receives the light transmitted through the spectroscope and captures a spectral image of the target object, and one or a plurality of processors, in which the one or the plurality of processors are programmed to execute a method including: controlling the spectroscope to obtain an inspection wavelength corresponding to the target object, and acquiring, from the camera, the spectral image based on the inspection wavelength, calculating a light intensity change amount that is a difference between a light intensity of each pixel of the spectral image and a predetermined reference value, calculating a parameter indicating variation in the light intensity change amount in a pixel range including a target pixel of the spectral image, and determining whether or not the parameter is within a predetermined range.