The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 15, 2021

Filed:

Apr. 26, 2019
Applicant:

Mapbox, Inc., San Francisco, CA (US);

Inventors:

Dana Alexander Sulit, Washington, DC (US);

Saman Bemel-Benrud, Washington, DC (US);

Eli Fitch, Washington, DC (US);

Nicki Zippora Dlugash, Washington, DC (US);

Assignee:

Mapbox, Inc., San Francisco, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/048 (2013.01); G06Q 50/16 (2012.01); G06F 16/29 (2019.01); G01C 21/36 (2006.01); G06Q 30/02 (2012.01);
U.S. Cl.
CPC ...
G06Q 50/16 (2013.01); G01C 21/367 (2013.01); G06F 16/29 (2019.01); G06Q 30/0201 (2013.01);
Abstract

A process, and corresponding system for performing the process, is described for editing and representing property values for a digital map. The process retrieves electronic map data from a style sheet corresponding to a vector map tile set for a digital map. The process displays a plurality of templates and receives selection of a template. The process displays a visual map representing the electronic map with the set of map style layers of the selected template. The process displays a theme and a plurality of components. Each component is a set of map style layers and is a subset of the set of map style layers of the template. The process receives selection of a component. The process displays a plurality of property values associated with the selected component. The process receives an edit to a property value. The process updates the visual map to reflect the edited property value.


Find Patent Forward Citations

Loading…