The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 15, 2021
Filed:
Mar. 29, 2018
Ca, Inc., New York, NY (US);
Smrati Gupta, San Jose, CA (US);
Erhan Giral, Saratoga, CA (US);
David Sanchez Charles, Barcelona, ES;
Victor Muntés-Mulero, Sant Feliu de Llobregat, ES;
CA, Inc., New York, NY (US);
Abstract
A multivariate clustering-based anomaly detector can generate an event for consumption by an APM manager that indicates detection of an anomaly based on multivariate clustering analysis after topology-based feature selection. The anomaly detector accumulates time-series data across a series of time instants to form a multivariate time-series data slice or multivariate data slice. The anomaly detector then performs multivariate clustering analysis with the multivariate data slice. The anomaly detector determines whether a multivariate data slice is within a cluster of multivariate data slices. If the multivariate data slice is within the cluster and the cluster is a known anomaly cluster, then the anomaly detector generates an anomaly detection event indicating detection of the known anomaly. The anomaly detector can also determine that a multivariate data slice is within an unknown cluster and generate an event indicating detection of an unknown anomaly.