The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 15, 2021

Filed:

Apr. 23, 2019
Applicant:

Institute for Information Industry, Taipei, TW;

Inventors:

Yen-Lin Chen, Taipei, TW;

Hong-Yi Liang, Taipei, TW;

Xiu-Zhi Chen, Kaohsiung, TW;

Chao-Wei Yu, Pingtung County, TW;

Meng-Tsan Li, Taichung, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01); G06K 9/46 (2006.01); G06N 3/04 (2006.01);
U.S. Cl.
CPC ...
G06K 9/4604 (2013.01); G06K 9/6256 (2013.01); G06K 9/6268 (2013.01); G06N 3/0454 (2013.01);
Abstract

A feature determination apparatus and method adapted to multiple object sizes are provided. The apparatus individually supplies each of the object images to a convolution neural network having several convolution layers to generate multiple feature maps corresponding to each object image. The apparatus calculates a feature amount of each feature image of each object image. The apparatus determines an invalid layer start number of each object image according to a preset threshold and the feature amount corresponding to each object image. The apparatus determines a feature map extraction recommendation for each of a plurality of object sizes according to a size of each object image and the invalid layer start number of each object image.


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