The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11036942 B1

PDF
Full Text
Expired
Date of Patent:
Jun. 15, 2021

Filed:

Dec. 23, 2019
Applicant:

Avery Dennison Retail Information Services Llc, Mentor, OH (US);

Inventors:

Brad Cumby, Liberty Township, OH (US);

Joseph Bernicke, Napoleon, OH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 7/00 (2006.01);
U.S. Cl.
CPC ...
G06K 7/0095 (2013.01);
Abstract

A method of stabilizing a RFID testing procedure for testing a RFID tag includes placing a RFID tag on a surface, placing a textile on the RFID tag and transmitting a first radio frequency signal to the RFID tag, and measuring a first signal from the RFID tag received in response to transmitting the first radio frequency signal to the RFID tag. The exemplary method further includes placing a first spacing object having a first spacing length between the RFID tag and the textile, the first spacing length extending from the RFID tag to the textile, transmitting a second radio frequency signal to the RFID tag, and measuring a second signal from the RFID tag received in response to transmitting the second radio frequency signal to the RFID tag. The method further includes analyzing the first signal and the second signal to determine whether the RFID tag is operational.


Find Patent Forward Citations

Cumby, Brad. (2021). Rfid textile testing system and method (U.S. Patent No. 11036942). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11036942

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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