The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 15, 2021

Filed:

Jun. 13, 2011
Applicants:

Vipul Ved Prakash, San Francisco, CA (US);

Lun Ted Cui, Fremont, CA (US);

Rishab Aiyer Ghosh, San Francisco, CA (US);

Thomas James Emerson, Mountain View, CA (US);

Inventors:

Vipul Ved Prakash, San Francisco, CA (US);

Lun Ted Cui, Fremont, CA (US);

Rishab Aiyer Ghosh, San Francisco, CA (US);

Thomas James Emerson, Mountain View, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 16/951 (2019.01); G06F 16/31 (2019.01);
U.S. Cl.
CPC ...
G06F 16/951 (2019.01); G06F 16/313 (2019.01);
Abstract

A new approach is proposed that contemplates systems and methods to examine and determine quality of objects cited by citations in a search result based on a citation graph that includes citing subjects, citations, and cited objects. First, influence scores of a plurality of subjects/sources that compose the citations of the objects in the search result are calculated. The quality of the objects cited by the subjects can then be determined by examining the influence scores for the subjects of the citations. Finally, the cited objects selected can be presented to a user or provided to a thirty party for further processing together with the relevant citations and citing subjects.


Find Patent Forward Citations

Loading…