The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 15, 2021
Filed:
Dec. 31, 2018
Microsoft Technology Licensing, Llc, Redmond, WA (US);
Shen Huang, San Jose, CA (US);
Huan Van Hoang, San Jose, CA (US);
Yongzheng Zhang, San Jose, CA (US);
Chi-Yi Kuan, Fremont, CA (US);
Microsoft Technology Licensing, LLC, Redmond, WA (US);
Abstract
Methods, systems, and computer programs are presented for selecting features for a machine-learning model configured to detect anomalies in the evolution of data over time. One method includes an operation for identifying one or more key fields and value fields from the fields in a relational database. The method also includes grouping data of the value fields based on values of the one or more key fields and calculating one or more statistical values for each group of data of the value fields. The method further includes operations for monitoring an evolution of the one or more statistical values over time, and for selecting, based on the evolution of the one or more statistical values over time, features to be used by a machine-learning model to detect anomalies in content of the relational database over time. The method also includes executing the machine-learning model to detect the anomalies.