The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 15, 2021
Filed:
Jun. 13, 2019
International Business Machines Corporation, Armonk, NY (US);
Andrew Hicks, Wappingers Falls, NY (US);
Dale E. Blue, Poughkeepsie, NY (US);
Ryan Thomas Rawlins, New Paltz, NY (US);
Rachel Brill, Haifa, IL;
Deborah A. Furman, Staatsburg, NY (US);
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
A method for automatically avoiding fault paths in software code of a System Under Test (SUT) includes generating a plurality of fingerprints by executing a plurality of regression tests. Each of the plurality of fingerprints uniquely identifies a specific code path in the software code of the SUT. A critical error is detected during execution of the software code of the SUT. A fault code path in the software code of the SUT associated with the critical error is identified by analyzing the plurality of generated fingerprints. At least one fingerprint associated with the fault code path in the software code of the SUT is identified. During subsequent execution of the software code of the SUT, the identified fault code path in the software code of the SUT is automatically prevented from being executed based on the identified at least one fingerprint.