The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 15, 2021
Filed:
Jan. 17, 2020
Ebay Inc., San Jose, CA (US);
Maxwell Henry Poole, San Jose, CA (US);
Ahmed Reda Mohamed Saeid Abdulaal, San Jose, CA (US);
Ajay Narendra Malalikar, Sunnyvale, CA (US);
Jonathan Ng, San Jose, CA (US);
Harsha Nalluri, San Jose, CA (US);
Craig H Fender, Morgan Hill, CA (US);
eBay Inc., San Jose, CA (US);
Abstract
A system is configured to detect a small, but meaningful, anomaly within one or more metrics associated with a platform. The system displays visuals of the metrics so that a user monitoring the platform can effectively notice a problem associated with the anomaly and take appropriate action to remediate the problem. A first visual includes a radar-based visual that renders an object representing data for a set of metrics being monitored. A second visual includes a tree map visual that includes sections where each section is associated with an attribute used to compose the set of metrics. Via the display of the visuals, the techniques provide an improved way of representing a large number of metrics (e.g., hundreds, thousands, etc.) being monitored for a platform. Moreover, the techniques are configured to expose useful information associated with the platform in a manner that can be effectively interpreted by a user.