The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 15, 2021
Filed:
Nov. 27, 2017
Omron Corporation, Kyoto, JP;
Shinsuke Kawanoue, Kyoto, JP;
Yoshihide Nishiyama, Yokohama, JP;
OMRON Corporation, Kyoto, JP;
Abstract
A control device includes feature amount generating means for generating a feature amount suitable for detecting an anomaly that occurs in a control target from data that relates to the control target, machine learning means for carrying out machine learning using the feature amount generated by the feature amount generating means, anomaly detecting means for detecting the anomaly, based on the feature amount generated by the feature amount generating means and an anomaly detection parameter determined based on a learning result of the machine learning and used in detection of the anomaly that occurs in the control target, instructing means for instructing the anomaly detecting means to perform detection of the anomaly, and data compressing means for data-compressing the feature amount generated by the feature amount generating means, and providing the data-compressed feature amount to the machine learning means and the anomaly detecting means.