The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 15, 2021

Filed:

Apr. 10, 2018
Applicant:

The Government of the United States of America, As Represented BY the Secretary of Homeland Security, Washington, DC (US);

Inventors:

Peter Roland Smith, Westfield, NJ (US);

James Christopher Weatherall, Linwood, NJ (US);

Jeffrey Brian Barber, Vineland, NJ (US);

Barry Thomas Smith, Egg Harbor, NJ (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01S 13/88 (2006.01); G01S 7/40 (2006.01); G01S 7/41 (2006.01); G01S 13/02 (2006.01); G01S 7/02 (2006.01);
U.S. Cl.
CPC ...
G01S 13/887 (2013.01); G01S 7/40 (2013.01); G01S 7/411 (2013.01); G01S 13/88 (2013.01); G01S 13/0209 (2013.01); G01S 2007/027 (2013.01);
Abstract

The present disclosure is directed to a measurement system for measuring a reflection coefficient of a test sample, including: a transceiver antenna configured to be coupled to a source of electromagnetic radiation; and a RAM positioned between the transceiver antenna and a measurement region of the transceiver antenna, wherein the RAM comprises an aperture substantially orthogonal to and substantially aligned with a transceiving axis of the transceiver antenna. A method for obtaining error correction of a measurement system and a method of measuring a reflection coefficient in a test sample are also provided.


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