The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 15, 2021
Filed:
Dec. 22, 2016
Leddartech Inc., Quebec, CA;
Samuel Gidel, Quebec, CA;
Vincent Simard-Bilodeau, Quebec, CA;
LEDDARTECH INC., Quebec, CA;
Abstract
A computer-implemented method and a system for at least partially removing intrinsic static noise from data obtained by an optical time-of-flight sensor using full-waveform analysis. The method includes receiving a plurality of calibration traces, the calibration traces being obtained in a controlled environment wherein no object is present in a field of view of the optical time-of-flight sensor; determining a noise template using the calibration traces by performing a statistical analysis on the calibration traces to determine a shape and an amplitude of the intrinsic static noise in the calibration traces; receiving a normal operation trace, the normal operation trace being obtained in an uncontrolled environment wherein a presence of the object in the field of view is unknown; subtracting the noise template from the normal operation trace, obtaining and outputting a denoised signal.