The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 15, 2021

Filed:

Apr. 17, 2019
Applicant:

Lapis Semiconductor Co., Ltd., Yokohama, JP;

Inventor:

Hiroji Akahori, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/02 (2006.01); G01V 3/02 (2006.01);
U.S. Cl.
CPC ...
G01N 27/028 (2013.01); G01V 3/02 (2013.01);
Abstract

An object-characteristic determination device includes a calculation unit and a determination unit. The calculation unit calculates a first feature value and a second feature value differing from the first feature value according to a first signal at a first frequency and a second signal at a second frequency. The first signal and the second signal are received by a reception unit after passing through the object. The first feature value and the second feature value represent features of the first signal and the second signal. The determination unit determines a property of the object on the basis of a difference in the first feature values of the first signal and a difference in the second feature values of the second signal, a relationship between a plurality of properties of the object, and a plurality of differences in the first feature values and a plurality of differences in the second feature values.


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