The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 15, 2021

Filed:

May. 13, 2019
Applicants:

Inventec (Pudong) Technology Corporation, Shanghai, CN;

Inventec Corporation, Taipei, TW;

Inventors:

Trista Pei-Chun Chen, Taipei, TW;

Wei-Chao Chen, Taipei, TW;

Shih-Sung Lin, Taipei, TW;

Assignees:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/88 (2006.01); G06T 7/00 (2017.01); G01N 21/95 (2006.01); G06T 7/11 (2017.01);
U.S. Cl.
CPC ...
G01N 21/8851 (2013.01); G01N 21/95 (2013.01); G06T 7/0004 (2013.01); G06T 7/11 (2017.01); G01N 2021/8893 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01);
Abstract

A surface defect detection method applied to a surface of an object is disclosed. The method includes obtaining an image of the surface, performing a deep learning algorithm by a computing device to set a plurality of bounding boxes in the image and to output a plurality of feature parameter sets associated with the plurality of bounding boxes, with each bounding box enclosing a possible defect of the surface, and performing a classifying algorithm by the computing device according to the bounding boxes and the feature parameters to determine whether the surface conforms to a specification.


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