The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 15, 2021
Filed:
Oct. 29, 2019
Corning Incorporated, Corning, NY (US);
William John Furnas, Elmira, NY (US);
CORNING INCORPORATED, Corning, NY (US);
Abstract
Methods of characterizing an optical retardance or a stress-related property of a glass-bases sample include directing a light beam into the glass-based sample while varying the polarization of the light beam to generate scattered light for each polarization are provided. The scattered light for each polarization is captured with an image sensor, which has an exposure time and a frame rate. The scattered light has an intensity distribution at the image sensor. The sample is moved so that the image sensor averages two or more different intensity distributions per frame to form an averaged intensity distribution for each polarization. The averaged intensity distributions for multiple frames are then used to characterize the optical retardance. The optical retardance can turn be used to determine stress-related properties of the glass-based sample. Moving the substrate reduces measurement noise scattered light having no optical retardance information.