The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 15, 2021
Filed:
Dec. 07, 2017
Endress+hauser Conducta Gmbh+co. KG, Gerlingen, DE;
Thomas Wilhelm, Chemnitz, DE;
Endress+Hauser Conducta GmbH+Co. KG, Gerlingen, DE;
Abstract
The present disclosure relates to a computer-implemented method for determining at least one measurement uncertainty for at least one measured value of a field device, in which a set of calculation parameters is created that contains at least all standard parameters of a set of standard parameters in the form of a respectively corresponding calculation parameter, and the at least one measurement uncertainty and/or a measurement uncertainty budget is calculated and/or specified based upon at least one calculation parameter value of at least one calculation parameter. Each standard parameter of the set of standard parameters comprising at least one standard parameter represents an independent variable causing the measurement uncertainty. To each calculation parameter is assigned at least one calculation parameter value in the form of at least one standard parameter value, one device parameter value, and/or one application parameter value.