The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 15, 2021

Filed:

Nov. 24, 2017
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Takahiro Yamada, Tokyo, JP;

Taisuke Takayanagi, Tokyo, JP;

Rintarou Fujimoto, Tokyo, JP;

Shinichiro Fujitaka, Tokyo, JP;

Takuya Nomura, Tokyo, JP;

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61N 5/10 (2006.01);
U.S. Cl.
CPC ...
A61N 5/103 (2013.01); A61N 5/1043 (2013.01); A61N 5/1071 (2013.01); A61N 5/1077 (2013.01); A61N 5/1067 (2013.01); A61N 2005/1074 (2013.01); A61N 2005/1087 (2013.01);
Abstract

There is provided a treatment planning system and a particle therapy system. In the related art, it is unable to determine optimum beam intensity in irradiation for which discrete spot irradiation and continuous beam irradiation coexist. There is provided a treatment planning system that includes a spot determination unit that divides an irradiation region to be irradiated with a charged particle beam into a plurality of layers in an advancing direction of the charged particle beam and disposes a plurality of irradiation spots, which becomes irradiation points of the charged particle beam, in the layers and a beam intensity determination unit that determines beam intensity for each of the layers by evaluating the irradiation time by changing the beam intensity in a range of a condition of change in dose distribution which is set in advance.


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