The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 15, 2021

Filed:

Sep. 19, 2016
Applicant:

Suricog, Paris, FR;

Inventors:

Marc Massonneau, Tillieres sur Avre, FR;

Marc Swynghedauw, Paris, FR;

Kristen Le Liboux, Paris, FR;

Assignee:

SURICOG, Paris, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/107 (2006.01); A61B 3/11 (2006.01); A61B 3/113 (2006.01); A61B 5/00 (2006.01); G06F 3/01 (2006.01); G06F 1/16 (2006.01); A61B 3/032 (2006.01);
U.S. Cl.
CPC ...
A61B 5/1072 (2013.01); A61B 3/11 (2013.01); A61B 3/111 (2013.01); A61B 3/113 (2013.01); A61B 5/1071 (2013.01); A61B 5/6803 (2013.01); A61B 5/6814 (2013.01); A61B 5/6815 (2013.01); G06F 1/163 (2013.01); G06F 3/013 (2013.01); A61B 3/032 (2013.01);
Abstract

The invention relates to a method for determining at least one ophthalmological parameter of a subject, consisting of the subject's semi-pupillary distances, comprising observing the subject's two eyes using an eye tracking device () borne by the subject and determining the aforementioned parameter at least from this observation.


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