The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 08, 2021

Filed:

Dec. 26, 2019
Applicant:

Korea Advanced Institute of Science and Technology, Daejeon, KR;

Inventors:

Seungwon Shin, Daejeon, KR;

Jaehyun Nam, Daejeon, KR;

JunSik Seo, Daejeon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 12/24 (2006.01); G06F 9/455 (2018.01); H04L 12/26 (2006.01);
U.S. Cl.
CPC ...
H04L 41/5009 (2013.01); G06F 9/45558 (2013.01); H04L 41/0893 (2013.01); H04L 41/0896 (2013.01); H04L 41/12 (2013.01); H04L 41/5054 (2013.01); H04L 43/0817 (2013.01);
Abstract

The inventive concept described herein relates to a performance analysis apparatus of VNF in a NFV platform and a method thereof that may analyze the performance of VNFs in an NFV platform and a factor that causes the performance to be degraded. A performance analysis apparatus of VNF that analyzes performance of the VNF within a NFV platform includes an NFV environment constituting unit generating a service chain composed of VNFs, using a VNF policy configuration of the VNF and configured to deploy the VNFs corresponding to the service chain in the NFV platform, a performance monitoring unit monitoring internal forms of the VNFs by measuring a performance feature of each component within the NFV platform and a performance feature for the service chain, and an analysis unit specifying a performance degradation VNF that degrades performance in the service chain to derive a cause.


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