The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 08, 2021

Filed:

Sep. 11, 2018
Applicant:

Toshiba Memory Corporation, Tokyo, JP;

Inventors:

Miki Toshima, Kanagawa, JP;

Sadatoshi Murakami, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/66 (2006.01); H01L 23/544 (2006.01); H01L 21/027 (2006.01); G01J 3/28 (2006.01);
U.S. Cl.
CPC ...
H01L 22/12 (2013.01); G01J 3/28 (2013.01); H01L 21/027 (2013.01); H01L 23/544 (2013.01); H01L 2223/54426 (2013.01);
Abstract

According to one embodiment, a quality control method of a position measurement light source includes irradiating light of the position measurement light source on a plurality of marks having different heights and measuring a relationship between the height of the mark and an intensity of light reflected by the mark. The quality control method includes identifying a wavelength of the position measurement light source by comparing measurement data acquired by the measuring to reference data of a relationship between the height of the mark and an intensity of reflected light for each of a plurality of wavelengths.


Find Patent Forward Citations

Loading…