The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 08, 2021

Filed:

Oct. 25, 2017
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventors:

Riki Kitano, Kyoto, JP;

Kazuhiro Kawamura, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01); H01J 49/06 (2006.01); G01N 30/72 (2006.01); H01J 49/10 (2006.01); H01J 49/42 (2006.01);
U.S. Cl.
CPC ...
H01J 49/067 (2013.01); G01N 30/7206 (2013.01); H01J 49/10 (2013.01); H01J 49/4215 (2013.01);
Abstract

Provided is a mass spectrometric method including steps of transporting ions generated in an ion sourceto a mass spectrometer sectionthrough an ion optical systemhaving a plurality of ion lensesand, and detecting the ions after performing mass separation of the ions. The method further includes steps of: adjusting a voltage applied to a first ion lenswhich is one of the ion lensesandso that the detection sensitivity for an ion having a predetermined mass-to-charge ratio satisfies a previously specified requirement; and applying, to a second ion lenswhich is one of the ion lensesandexcept the first ion lens, a voltage at which a change in the ion detection sensitivity with respect to the voltage applied to the second ion lensis within a previously specified range.


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