The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 08, 2021

Filed:

Oct. 29, 2018
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventors:

Xiaoqiang Zhang, Shanghai, CN;

Yunqing Huang, Shanghai, CN;

Wenjian Sun, Shanghai, CN;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01); G01N 30/72 (2006.01); H01J 49/40 (2006.01); H01J 49/06 (2006.01); H01J 49/42 (2006.01);
U.S. Cl.
CPC ...
H01J 49/0036 (2013.01); G01N 30/7233 (2013.01); H01J 49/0045 (2013.01); H01J 49/062 (2013.01); H01J 49/40 (2013.01); H01J 49/427 (2013.01); H01J 49/429 (2013.01);
Abstract

A data acquisition method in a mass spectrometer includes a. providing an ion source to generate precursor ions; b. feeding the precursor ions into a first mass analyzer that selects one mass window such that the precursor ions located outside the mass window pass through the first mass analyzer and the precursor ions located within the mass window cannot pass through the first mass analyzer; c. feeding the precursor ions passing through the first mass analyzer into a collision cell for collisional dissociation, to generate product ions; d. feeding the product ions into a second mass analyzer for mass analysis and recording a spectrum; and e. repeating Steps b-d. Each time when Step b is repeatedly performed, the selected mass window does not overlap with all the mass windows previously selected. After all the mass windows in a mass range are selected, the repetition is stopped.


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