The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 08, 2021

Filed:

Sep. 05, 2017
Applicant:

National Institute of Advanced Industrial Science and Technology, Tokyo, JP;

Inventor:

Hideyuki Tanaka, Nagareyama, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/73 (2017.01); G01B 11/26 (2006.01); G06T 1/00 (2006.01); G01B 11/00 (2006.01); G06T 7/90 (2017.01);
U.S. Cl.
CPC ...
G06T 7/73 (2017.01); G01B 11/002 (2013.01); G01B 11/26 (2013.01); G06T 1/00 (2013.01); G06T 7/90 (2017.01); G06T 2207/10024 (2013.01); G06T 2207/30204 (2013.01);
Abstract

The present invention provides a marker that can uniquely estimate the posture within wide-angle range while maintaining the flatness, and a posture estimating method. The marker includes a two-dimensional pattern code and a posture detection pattern emitting different light depending on an observation direction of the pattern code at around the first axis on a two-dimensional plane formed by the pattern code. The method using the marker has a Step-of using a captured image of the marker to identify a color of the light or a pattern drawn by the light, Step-of determining, depending on the color or the pattern identified in Step-, a posture of the marker at around the first axis, and a Step-of determining a posture of the marker depending on a positional relation between the posture at around the first axis determined in Step-and the elements constituting the captured image.


Find Patent Forward Citations

Tanaka, Hideyuki. (2021). Marker and posture estimating method using marker (U.S. Patent No. 11030770). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11030770

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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