The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 08, 2021

Filed:

Aug. 19, 2019
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventor:

Takashi Wakui, Ashigarakami-gun, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/11 (2017.01); G06T 7/00 (2017.01); G06T 7/136 (2017.01);
U.S. Cl.
CPC ...
G06T 7/11 (2017.01); G06T 7/0012 (2013.01); G06T 7/136 (2017.01); G06T 2207/30024 (2013.01);
Abstract

Provided are a cell image evaluation device, method, and program which are capable of performing more accurate and high reliable evaluation even though a captured image of each part to be observed within a container is an image of which contrast is low due to influence of meniscus. The cell image evaluation device includes a region determination unit that determines whether a captured image obtained by capturing an inside of a container that contains a cell is an image obtained by capturing a meniscus region within the container or an image obtained by capturing a non-meniscus region within the container and an image evaluation unit that evaluates a state of the cell included in the captured image. The image evaluation unit evaluates the image of the meniscus region and the image of the non-meniscus region by different evaluation methods.


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