The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 08, 2021
Filed:
Mar. 07, 2019
Fraunhofer-gesellschaft Zur Foerderung Der Angewandten Forschung E.v., Munich, DE;
Andreas Ernst, Erlangen, DE;
Mathis Hoffmann, Erlangen, DE;
Jens-Uwe Garbas, Erlangen, DE;
Tobias Bergen, Erlangen, DE;
Abstract
A method for detecting a known pattern having homogeneous areas includes the steps of taking an image of the known pattern or, of at least a portion of the known pattern, and performing detection. Detection includes an initial detection of a first region of the image and the detection of a feature of the known pattern within a second region of the image. The second region is arranged adjacent to the first region. The initial detection is aimed at estimating at least one region parameter, such as a position of the region of the pattern, and/or orientation of the region or distortion of same. Starting from this, the second region can be selected in which a feature, such as a corner of the checkerboard is detectable. This second detection step is aimed at obtaining at least one region parameter such as the position of a feature within the second region.