The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 08, 2021
Filed:
Sep. 30, 2019
International Business Machines Corporation, Armonk, NY (US);
Lahiruka Winter, Fishkill, NY (US);
Daniel Saconn, Peekskill, NY (US);
Kyle Phillips, Poughkeepsie, NY (US);
Connor Nace, Wappingers Falls, NY (US);
Zachary Neumann, Wappingers Falls, NY (US);
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
Systems and methods to implement performance monitoring of a device under test involve defining one or more sequences. Each of the one or more sequences includes two or more events, each of the two or more events being defined by one or more hardware signals that include a hardware register value, transmission of a message or signal, or a wire voltage change. A method includes initiating a simulation of the device under test by inputting one or more signals at one or more inputs of the device under test for propagation across the device under test, and monitoring completion of the two or more events defining each of the one or more sequences. Performance of the device under test is reported. Reporting includes providing latency of each of the one or more sequences. A final design of the device under test is provided for fabrication based on the performance monitoring.