The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 08, 2021
Filed:
Jan. 18, 2018
Fmr Llc, Boston, MA (US);
Ratnesh Kumar Singh, Bangalore, IN;
Ambica Rajagopal, Pune, IN;
Akhilesh Raghavendrachar Srinivasachar Kaddi, Bangalore, IN;
Harikrishnan Choondani Velayudhan, Kerala, IN;
Stephanie Trethaway, Westford, MA (US);
FMR LLC, Boston, MA (US);
Abstract
Methods and apparatuses are described for system for identifying and mitigating high-risk database queries through ranked variance analysis. A server identifies database queries executed against databases in a production computing environment within a predetermined time period, each database query associated with execution plans and each execution plan having corresponding plan data elements. For each database query: the server generates execution variance data for the execution plans for a database query based upon the corresponding plan data elements, comprising: determining an execution time variance between the execution plans; and determining a buffer gets variance between the execution plans. The server ranks the database queries according to (i) the execution time variance, and (ii) the buffer gets variance. The server computing device identifies high-risk database queries based upon the rank, and adjusts execution settings for each of the identified high-risk database queries to mitigate performance degradation in the production computing environment.