The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 08, 2021

Filed:

Aug. 27, 2018
Applicant:

Anodot Ltd., Ra'anana, IL;

Inventors:

Yoni Yom Tov Ben Simhon, Natanya, IL;

David Drai, Natanya, IL;

Ira Cohen, Reut, IL;

Assignee:

Anodot Ltd., Ra'anana, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/34 (2006.01); G06F 11/07 (2006.01); H04L 12/26 (2006.01);
U.S. Cl.
CPC ...
G06F 11/076 (2013.01); G06F 11/0721 (2013.01); G06F 11/3447 (2013.01); G06F 11/3452 (2013.01); H04L 43/0823 (2013.01); H04L 43/16 (2013.01); G06F 11/079 (2013.01); G06F 11/34 (2013.01); H04L 43/08 (2013.01);
Abstract

A system includes a normal behavior characterization module configured to receive values for a first metric of a plurality of metrics and generate a baseline profile indicating normal behavior of the first metric based on the received values. The system also includes an anomaly identification module configured to identify an anomaly in response to present values of the metric deviating outside the baseline profile. The system also includes an anomaly behavior characterization module configured to analyze a plurality of prior anomalies identified by the anomaly identification module and develop a model of the anomalies of the first metric. The system also includes an anomaly scoring module configured to determine a first score for a present anomaly detected by the anomaly identification module for the first metric. The first score is based on characteristics of the present anomaly and the model of the anomalies of the first metric.


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