The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 08, 2021

Filed:

May. 15, 2019
Applicant:

Emc Ip Holding Company Llc, Hopkinton, MA (US);

Inventors:

Jonathan Krasner, Coventry, RI (US);

Sweetesh Singh, Benares, IN;

Steven Chalmer, Redwood City, CA (US);

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01); G06N 20/00 (2019.01); H04L 9/06 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0641 (2013.01); G06F 3/0608 (2013.01); G06F 3/0659 (2013.01); G06F 3/0673 (2013.01); G06N 20/00 (2019.01); H04L 9/0643 (2013.01);
Abstract

Disclosed are techniques for data deduplication, which include methods, systems, or computer products for reducing data redundancy in a data storage system comprising searching a cluster of nearest neighbors, wherein the cluster has been created using a locality sensitive hashing algorithm, to determine if a data block has been stored in the data storage system prior to writing the data block. In alternate embodiments, the nearest neighbor clusters could be created using one or more of the following algorithms: k-means clustering algorithm, a k-medoids clustering algorithm, a mean shift algorithm, a generalized method of moment (GMM) algorithm, or a density based spatial clustering of applications with noise (DBSCAN) algorithm.


Find Patent Forward Citations

Loading…