The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 08, 2021

Filed:

Nov. 17, 2017
Applicant:

United Technologies Corporation, Farmington, CT (US);

Inventors:

Rebecca L. Runkle, Manchester, CT (US);

Anthony Patrick Ventura, South Glastonbury, CT (US);

Thomas Anthony Rebbecchi, Hartford, CT (US);

Assignee:

Raytheon Technologies Corporation, Farmington, CT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 19/4155 (2006.01); B33Y 10/00 (2015.01); B33Y 50/02 (2015.01); G06F 30/17 (2020.01); B22F 10/20 (2021.01); G06F 119/08 (2020.01); B22F 10/30 (2021.01);
U.S. Cl.
CPC ...
G05B 19/4155 (2013.01); B22F 10/20 (2021.01); B33Y 10/00 (2014.12); B33Y 50/02 (2014.12); G06F 30/17 (2020.01); B22F 10/30 (2021.01); G05B 2219/31372 (2013.01); G05B 2219/49018 (2013.01); G06F 2119/08 (2020.01);
Abstract

A method of fabricating process-equivalent test specimens to an additively manufactured component includes generating a processing history model of a component, dividing the component into regions based on input data variations in processing history, wherein each region is characterized by an identified range of input data, determining additive manufacturing processing parameters needed to additively manufacture one or more test specimens that each mimic the processing history in one of the regions, and fabricating the one or more test specimens using the processing parameters determined.


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