The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 08, 2021

Filed:

Mar. 11, 2019
Applicants:

Hoya Lens Thailand Ltd., Pathumthani, TH;

The Hong Kong Polytechnic University, Kowloon, HK;

Inventors:

Chi Ho To, Kowloon, HK;

Siu Yin Lam, Kowloon, HK;

Takashi Hatanaka, Pathumthani, TH;

Yasutake Masuda, Pathumthani, TH;

Assignees:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02C 7/06 (2006.01);
U.S. Cl.
CPC ...
G02C 7/06 (2013.01); G02C 2202/24 (2013.01);
Abstract

A spectacle lens can inhibit ametropia of the eyes and ensure full visibility. The spectacle lens comprises: first refraction areas and second refraction areas. Each first refraction area has a first refraction force that may be based on a prescription for correcting the ametropia of the eyes. Each second refraction area has a refraction force different from the first refraction force and may function to focus images on the positions except the retina of the eyes, to inhibit the development of the ametropia. Near the central part of the lens, the second refraction areas form a plurality of independent island-shaped areas, and the first refraction areas form the areas beyond the areas of the second refraction areas.


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