The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 08, 2021

Filed:

Aug. 06, 2018
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventor:

Kenta Matsubara, Ashigarakami-gun, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 7/28 (2021.01); G02B 21/26 (2006.01); G02B 7/36 (2021.01); G02B 21/24 (2006.01); G02B 21/06 (2006.01); G03B 13/32 (2021.01); H04N 5/232 (2006.01);
U.S. Cl.
CPC ...
G02B 7/28 (2013.01); G02B 7/36 (2013.01); G02B 21/06 (2013.01); G02B 21/241 (2013.01); G02B 21/244 (2013.01); G02B 21/245 (2013.01); G02B 21/248 (2013.01); G02B 21/26 (2013.01); G03B 13/32 (2013.01); H04N 5/23212 (2013.01);
Abstract

A microscope includes an illumination light emission unitthat emits illumination light, a stageon which a culture containeris placed, an objective lenson which the illumination light having passed through the culture containerand the stageis incident, a focusing light emission unitthat emits focusing light, a reflected light detection unitthat detects reflected light due to emission of the focusing light, a distance changing unitthat changes a distance between the objective lensand the stage, an autofocus control unitthat performs autofocus control based on the reflected light, and a focus control information acquisition unitthat acquires focus control information including information of the culture container, the amount of culture solution C, and the magnification of the objective lens


Find Patent Forward Citations

Matsubara, Kenta. (2021). Microscope and observation method (U.S. Patent No. 11029486). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11029486

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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