The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 08, 2021

Filed:

Feb. 01, 2018
Applicant:

Beijing Voyager Technology Co., Ltd., Beijing, CN;

Inventors:

Xufeng Han, Mountain View, CA (US);

Tingbo Hou, Santa Clara, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 3/08 (2006.01); G01S 7/497 (2006.01); G01S 17/89 (2020.01); G01S 17/42 (2006.01); G01C 21/00 (2006.01);
U.S. Cl.
CPC ...
G01S 7/4972 (2013.01); G01C 21/005 (2013.01); G01S 7/497 (2013.01); G01S 17/42 (2013.01); G01S 17/89 (2013.01);
Abstract

Systems and methods are provided for calibrating light intensity. An exemplary method for light intensity calibration may comprise: obtaining a plurality of intensity distributions of reflected light from an area, wherein each of the intensity distributions is associated with a beam; determining a reference intensity distribution from the plurality of intensity distributions, wherein the reference intensity distribution is associated with a reference beam, the plurality of intensity distributions excluding the reference intensity distribution are non-reference intensity distributions, and the non-reference intensity distributions are each associated with a non-reference beam; and aligning each of the non-reference intensity distributions to the reference distribution to calibrate the non-reference intensity distributions against the reference distribution.


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