The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 08, 2021
Filed:
Dec. 20, 2017
Olympus America Inc., Center Valley, PA (US);
Jason Habermehl, Quebec, CA;
Benoit Lepage, Quebec, CA;
Olympus America Inc., Center Valley, PA (US);
Abstract
Disclosed is an apparatus and method for TFM post-processing of a FMC or HMC matrix acquired with an ultrasonic array probe. Post-processing is performed by calculating TFM beam forming amplitudes using round-trip delays to a focal point lying at depth d on a line at angle θ within the test object. Based on the beam forming amplitudes over a range of values of d within the imaging volume, a calculated A-scan is derived, which is equivalent to the response A-scan produced in conventional phased array imaging, but has the advantage of being focused at all points along the line. By post-calculation of calculated A-scans over a range of angles θ within the imaging volume, an imaging method is derived which is readily adapted to existing codes based on conventional A-scan imaging.