The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 08, 2021
Filed:
Feb. 06, 2019
Fujifilm Corporation, Tokyo, JP;
Yasuhiko Kaneko, Tokyo, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
An object of the present invention is to provide a defect inspection device, a defect inspection method, and a program that support an image interpreter so that image interpretation can be performed accurately and rapidly. A defect inspection device () includes an image acquisition unit, an image processing unit, a storage unit (), a defect candidate classification unit that assigns a defect classification to an extracted defect candidate image on the basis of classification information stored in the storage unit (), a display unit () that displays the received light image, a manipulation unit () that receives selection of a display or a non-display of an auxiliary indication indicating a position of the defect candidate image and the classification of the defect candidate image on the display unit (), and outputs a command for the selected display or non-display of the auxiliary indication, and a display control unit that performs a display or a non-display of the auxiliary indication on the display unit () on the basis of the command output from the manipulation unit ().