The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 08, 2021
Filed:
Feb. 13, 2015
Applicant:
Artium Technologies, Inc., Sunnyvale, CA (US);
Inventors:
William D. Bachalo, Los Altos Hills, CA (US);
Gregory A. Payne, Richland, WA (US);
Khalid Ibrahim, Hatfield, PA (US);
Michael J. Fidrich, San Jose, CA (US);
Chad M. Sipperley, Palm City, FL (US);
Assignee:
Artium Technologies, Inc., Sunnyvale, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 15/14 (2006.01); G01N 15/02 (2006.01); G01N 15/10 (2006.01);
U.S. Cl.
CPC ...
G01N 15/1429 (2013.01); G01N 15/0205 (2013.01); G01N 15/0211 (2013.01); G01N 15/1434 (2013.01); G01N 2015/1075 (2013.01); G01N 2015/145 (2013.01); G01N 2015/1461 (2013.01); G01N 2015/1493 (2013.01);
Abstract
Methods and apparatuses to detect particles in dense particle fields are described. A time varying signal is partitioned into a plurality of segments. Parameters are determined from the segments. The time varying signal is parsed into a plurality of individual particle signal components based on the plurality of parameters.