The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 08, 2021

Filed:

Oct. 20, 2017
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Shohei Kinoshita, Tokyo, JP;

Shigeru Kasai, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 7/02 (2006.01); G01N 29/07 (2006.01);
U.S. Cl.
CPC ...
G01M 7/025 (2013.01); G01M 7/02 (2013.01); G01N 29/075 (2013.01);
Abstract

An assessing device capable of assessing presence or absence of local damage in a structure is provided. The assessing device includes a dominant frequency identifying unit that identifies a dominant frequency of a vibration at each of a plurality of spots in a structure, based on information indicating the vibration at each of the plurality of spots, a phase difference identifying unit that identifies a phase difference at the dominant frequency between the vibrations at the plurality of spots, based on the dominant frequency and information indicating the vibrations; and an assessing unit that assesses damage in the structure, based on the phase difference.


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