The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 08, 2021

Filed:

Aug. 14, 2017
Applicant:

Fujitsu Limited, Kawasaki, JP;

Inventors:

Kazushi Uno, Atsugi, JP;

Takahiro Arioka, Isehara, JP;

Takeo Kasajima, Machida, JP;

Hiroyuki Fukuda, Yokohama, JP;

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 23/02 (2006.01); G01K 11/32 (2021.01); G01K 3/00 (2006.01); G01M 3/00 (2006.01); G05B 19/042 (2006.01); G01K 11/324 (2021.01);
U.S. Cl.
CPC ...
G01K 11/32 (2013.01); G01K 3/005 (2013.01); G01M 3/002 (2013.01); G05B 23/0243 (2013.01); G01K 11/324 (2021.01); G05B 19/0425 (2013.01); G05B 23/0235 (2013.01);
Abstract

A determination device includes: a memory; and a processor coupled to the memory and the processor configured to executes a process, the process comprising: generating a reference model of a sensor detection value; determining whether a time from a predetermined point in time until a deviation between the reference model and the sensor detection value exceeds a threshold is shorter than a predetermined time; and outputting a signal associated with an abnormality when the time is determined to be shorter.


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