The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 08, 2021
Filed:
May. 23, 2018
Flir Systems, Inc., Wilsonville, OR (US);
Jeffrey D. Frank, Santa Barbara, CA (US);
Theodore R. Hoelter, Santa Barbara, CA (US);
Nicholas Högasten, Santa Barbara, CA (US);
Austin A. Richards, Santa Barbara, CA (US);
Michael Kent, Goleta, CA (US);
Julie R. Moreira, Goleta, CA (US);
Pierre Boulanger, Goleta, CA (US);
Raymond Valdes, Walnut Park, CA (US);
Jonathan Li, Goleta, CA (US);
FLIR Systems, Inc., Wilsonville, OR (US);
Abstract
Flight based infrared imaging systems and related techniques, and in particular UAS based thermal imaging systems, are provided to improve the monitoring capabilities of such systems over conventional infrared monitoring systems. An infrared imaging system is configured to compensate for various environmental effects (e.g., position and/or strength of the sun, atmospheric effects) to provide high resolution and accuracy radiometric measurements of targets imaged by the infrared imaging system. An infrared imaging system is alternatively configured to monitor and determine environmental conditions, modify data received from infrared imaging systems and other systems, modify flight paths and other commands, and/or create a representation of the environment.