The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 08, 2021
Filed:
Apr. 14, 2017
U.s.a., As Represented BY the Administrator of the National Aeronautics and Space Administration, Washington, DC (US);
Joseph N. Zalameda, Poquoson, VA (US);
Eric R. Burke, Yorktown, VA (US);
Robert A. Hafley, Yorktown, VA (US);
Christopher S. Domack, Carrollton, VA (US);
UNITED STATES OF AMERICA AS REPRESENTED BY THE ADMINISTRATOR OF NASA, Washington, DC (US);
Abstract
Systems and methods are provided for the real time inspection of additive manufacturing deposits using infrared thermography. Various embodiments may enable the measurement of material properties and the detection of defects during the additive manufacturing process. Various embodiments may enable the characterization of deposition quality, as well as the detection of deposition defects, such as voids, cracks, disbonds, etc., as a structure is manufactured layer by layer in an additive manufacturing process. Various embodiments may enable quantitative inspection images to be archived and associated with the manufactured structure to document the manufactured structure's structural integrity.