The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 08, 2021
Filed:
Jan. 29, 2019
Fraunhofer-gesellschaft Zur Foerderung Der Angewandten Forschung E.v., Munich, DE;
Mahmoud Amr, Fuerth, DE;
Tobias Schoen, Nuremberg, DE;
Abstract
A method for calibrating an X-ray system having a radiation source and a radiation detector has the steps of establishing a kinematic model for at least one position, setting starting values, calibrating and solving a system of equations by means of minimizing. The system of equations is set up by the respective established kinematic model of the X-ray system, wherein the system of equations has respective sets of kinematic parameters for each position, and parameters to be calibrated which are usually equal over all the positions. In the step of setting the starting values, the parameters to be calibrated are set and, based on these, in the step of calibrating, at least one recording is taken by means of calibration bodies so that a comparison of the measuring results to respective references results in an error measure. This error measure is minimized when solving the system of equations.