The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 01, 2021

Filed:

Feb. 27, 2017
Applicant:

Sony Corporation, Tokyo, JP;

Inventors:

Richmond Hicks, Beaverton, OR (US);

Sundeep Raniwala, Mountain View, CA (US);

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 13/239 (2018.01); G01B 11/25 (2006.01); G01B 11/27 (2006.01); G06T 7/80 (2017.01); G06T 7/521 (2017.01); G06T 7/593 (2017.01); H04N 13/00 (2018.01); H04N 13/128 (2018.01); H04N 13/271 (2018.01); H04N 13/246 (2018.01); H04N 17/00 (2006.01);
U.S. Cl.
CPC ...
H04N 13/239 (2018.05); G01B 11/2504 (2013.01); G01B 11/2545 (2013.01); G01B 11/272 (2013.01); G06T 7/521 (2017.01); G06T 7/593 (2017.01); G06T 7/85 (2017.01); H04N 17/002 (2013.01); G06T 2207/10012 (2013.01); G06T 2207/10024 (2013.01); G06T 2207/10048 (2013.01); H04N 13/128 (2018.05); H04N 13/246 (2018.05); H04N 13/271 (2018.05); H04N 2013/0081 (2013.01);
Abstract

Calibration in the field is described for stereo and other depth camera configurations using a projector One example includes imaging the first and the second feature in a first camera of the camera system wherein the distance from the first camera to the projector is known, imaging the first and the second feature in a second camera of the camera system, wherein the distance from the second camera to the projector is known, determining a first disparity between the first camera and the second camera to the first feature, determining a second disparity between the first camera and the second camera to the second feature, and determining an epipolar alignment error of the first camera using the first and the second disparities.


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